Supplement Number 1

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Authors: Songming Miao, Xinyi Tang, Guangwei Xu, Yuanbiao Li, Xiao Chen, Di Lu, Shibing Long
Cited by: 0

Abstract

Materials and methods and additional figures including device fabrication process, XRD and XPS patterns, AFM images, TEM images, quasi-static capacitance-voltage (QSCV) measurement methods and results, time-dependent dielectric breakdown behavior of the devices

Fields of Study & Subjects

Semiconductor materials and devices Ferroelectric and Negative Capacitance Devices Dielectric properties of ceramics

Publication details

Journal / source
AIP Publishing
Publication date
1 January 2026
Document type
Dataset