Supplementary materials

AIP Publishing 2026 Open access

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Authors: Xingtai Chen, Xue He, Rui Wu, Ruichen Xie, Jinbo Yang, Peter Bencok, P. Steadman, Wenqing Liu
DOI: 10.60893/figshare.apl.31056418
Cited by: 0

Abstract

The supplementary materials supply the Raman spectroscopy, reliability analysis of XMCD sum rules, and the raw M-H curves measured by XMCD

Fields of Study & Subjects

Magnetic properties of thin films X-ray Spectroscopy and Fluorescence Analysis Magnetic Properties of Alloys

Publication details

Journal / source
AIP Publishing
Publication date
1 January 2026