Supplement Number 1
Abstract
Supplementary material including additional electrical characteristics, GI-XRD analysis, AFM surface morphology, TCAD simulation parameters, and extended discussion supporting the main text.
Fields of Study & Subjects
Semiconductor materials and devices
Semiconductor materials and interfaces
Advancements in Semiconductor Devices and Circuit Design
Publication details
- Journal / source
- AIP Publishing
- Publication date
- 1 January 2026
- Language
- EN