Supplementary Material

Figshare 2026 Open access

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Authors: Haodong Wang, Hongwei Gao, Yaozong Zhong, Xinchen Ge, Xiaolu Guo, yifan Dong, Xin Chen (14149), Xinkun Zhang, Meixin Feng, Qian Sun, Hui Yang
DOI: 10.60893/figshare.apl.31345147
Cited by: 0

Abstract

XPS surface stoichiometry analysis, multi-point TLM measurements and IV Characteristics of samples.

Fields of Study & Subjects

Electron and X-Ray Spectroscopy Techniques Semiconductor materials and interfaces Semiconductor materials and devices

Publication details

Journal / source
Figshare
Publication date
4 March 2026
Language
EN