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AIP Publishing 2026 Open access

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Authors: Dmitry Kalanov, Andriy Lotnyk, Jürgen Gerlach, Vladimir V. Roddatis, C. Petersen, Carsten Bundesmann, Holger von Wenckstern, Yeliz Unutulmazsoy
DOI: 10.60893/figshare.jap.30822923
Cited by: 0

Abstract

Figures S1-S3 present additional rocking curves and rocking curve FWHMs as functions of thin film thickness and instrumental resolution. Figure S4 shows supplementary out-of-plane and in-plane RSM maps for a 22 nm thick IBSD-grown film. Figure S5 and S6 show additional TEM images, SAED patterns, and an illustration of atomic arrangements supporting the analysis of STEM-HAADF data. An additional paragraph discussed the d-spacings estimated from SAED patterns.

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Journal / source
AIP Publishing
Publication date
1 January 2026