Regular and twin grains in GeTe thin films on miscut silicon substrates

AIP Publishing 2026 Open access

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Authors: Léa Meynier, Fabio Verducci, Guillaume Ayala, Boris Croes, Fabien Cheynis, Pierre Muller, Stefano Curiotto, S. Cherifi, Frédéric Leroy
DOI: 10.60893/figshare.jap.30834353
Cited by: 0

Abstract

S1: 2-dimensional x-ray diffraction patterns on GeTe thin films on Si(9 9 11) S2: 2-dimensional x-ray diffraction patterns on GeTe thin films on Si(443)

Publication details

Journal / source
AIP Publishing
Publication date
1 January 2026