Supplementary material

AIP Publishing 2026 Open access

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Authors: Dinesh Dudi, Kartikey Bhardwaj, S. Panwar, Anirban Mitra
DOI: 10.60893/figshare.jap.31287412
Cited by: 0

Abstract

The FESEM and AFM images for different thin films deposited at different alloy ratios. EDS image of alloy film at different target pulse ratios. Concentration ratio of Cu-Au alloy measured by EDS and XPS. X-ray diffraction patterns of the CuXAu1-X alloy thin film.

Fields of Study & Subjects

Advanced Materials and Semiconductor Technologies Chalcogenide Semiconductor Thin Films Metal and Thin Film Mechanics

Publication details

Journal / source
AIP Publishing
Publication date
1 January 2026
Language
EN