Supplementary Material: Subpicosecond thermalization of carriers in polar GaN/AlN quantum dots
Abstract
The supplementary materials presents: structural properties of our sample measured by STEM and STEM-CL, a detailed description of the pump-probe experimental set-up, and additional TRPL decays.
Fields of Study & Subjects
GaN-based semiconductor devices and materials
Semiconductor Quantum Structures and Devices
Strong Light-Matter Interactions
Publication details
- Journal / source
- AIP Publishing
- Publication date
- 26 February 2026
- Language
- EN