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Authors: Dae-Yun Kim, Seon-Myeong Choi, Dae Seok Han, June‐Young Lee, Kiho Kim, Hyeokshin Kwon, Jaeho Shin
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Abstract

Section I. Details of the fabrication process Section II. R_n measurement procedure Section III. x and y measurement procedure Section IV. Reproducibility of the JJ fabrication process Section V. Critical dimension scanning electron microscopy analysis Section VI. Deviation analysis of model predictions

Fields of Study & Subjects

Superconducting and THz Device Technology Physics of Superconductivity and Magnetism Superconducting Materials and Applications

Publication details

Journal / source
AIP Publishing
Publication date
16 March 2026
Language
EN