Supplementary Material

AIP Publishing 2026 Open access

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Authors: Kelly Xiao, Yuejun Shen, Artūras Vailionis, Alec M. Skipper, Anna-Katharina Preidl, Aaron M. Lindenberg, Kunal Mukherjee
DOI: 10.60893/figshare.jva.30908015
Cited by: 0

Abstract

The supplementary material contains: AFM, SEM, and Raman spectroscopy of thermally annealed films; AFM of additional laser-crystallized spot; GIXS analysis of thermally annealed and laser-crystallized film; AFM, SEM, XRD/GIXS, and Raman spectroscopy comparison of selenium-excess films on GaAs and SiO2 substrates; reflectance estimation calculations.

Fields of Study & Subjects

Chalcogenide Semiconductor Thin Films Phase-change materials and chalcogenides Thin-Film Transistor Technologies

Publication details

Journal / source
AIP Publishing
Publication date
1 January 2026