Supplementary Information
Abstract
See the Supplementary Information for (i) verification of the linear response of the EOS detection in 2-mm-thick ZnTe crystal, (ii) measurement of the 2D THz background spectrum in the absence of silicon sample, and (iii) field‑dependence of the nonlinear signal amplitudes.
Fields of Study & Subjects
Terahertz technology and applications
Advanced Semiconductor Detectors and Materials
Photorefractive and Nonlinear Optics
Publication details
- Journal / source
- AIP Publishing
- Publication date
- 3 March 2026
- Language
- EN