Atomic resolution cryo-EM at 200 keV

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Authors: Radostin Danev, Haruaki Yanagisawa, Keitaro Yamashita, Fabian Eisenstein, Masahide Kikkawa
Cited by: 2
References: 35

Abstract

Abstract Atomic resolution in cryo-electron microscopy was first demonstrated six years ago. This was accomplished using 300 kV electron microscopes equipped with new hardware that provided narrower energy spread, aberration correction, and energy filtering. Here, we report the achievement of 1.24 Å atomic resolution on an upgraded 200 kV electron microscope featuring a cold field emission gun, a high-resolution objective lens polepiece, and an energy filter. These components transform the instrument into a cost-effective single particle cryo-EM platform with performance comparable to that of significantly more expensive 300 kV systems. The microscope can also be operated at 100 kV and by using a high-speed hybrid-pixel detector we were able to reach sub-2 Å resolution.

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Electron and X-Ray Spectroscopy Techniques Crystallography and Radiation Phenomena

Publication details

Journal / source
bioRxiv (Cold Spring Harbor Laboratory)
Publisher
openRxiv
Publication date
9 January 2026
Document type
Preprint