X-ray diffraction data for APt2Si2, A = Nd, Pr
Abstract
This dataset consists of temperature dependent x-ray diffraction text files for two systems NdPt2Si2 and PrPt2Si2 and was collected at Argonne National Laboratory. The analysis on this system has been completed and ready for the submission for publication and we are making the experimental text files available and are compressed zipped folder.
Fields of Study & Subjects
Rare-earth and actinide compounds
Magnetic Properties of Alloys
Physics of Superconductivity and Magnetism
Publication details
- Journal / source
- Harvard Dataverse
- Publication date
- 9 February 2026
- Language
- EN
- Document type
- Dataset